Handlers

Cohu® is a global technology leader supplying test, automation, inspection & metrology products and services to the semiconductor industry. Cohu’s differentiated and broad product portfolio enables optimized yield and productivity, accelerating customers’ manufacturing time-to-market.

Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.

Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.

Markets We serve

• Automotive
• Computing and Network
• Consumer
• Industrial and Medical
• IoT/IoV and Optoelectronics
• Mobility

Customer Benefits

• Temperature Control
• Active Thermal Control
• Motion Control
• UPH
• Intelligent Contactors
• Industry 4.0 Ready

Test Handlers

Pick-and-Place

Delta Eclipse

Configurable OSAT Friendly Pick-and-Place Handler

Eclipse test handler delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors.

Delta MATRiX

High Parallel Tri-Temp Pick-and-Place Handler

MATRiX handler has a highly flexible test site configuration that is well suited for a wide range of test applications.

MT9510 XP / x16

Tri-Temp Pick-and-Place Handler

The MT9510 test handler is a universal pick-and-place handler for packages such as QFP, BGA, Micro-BGA, CSP, TSSOP, PLCC, PGA, LGA, MLP/MLF.

A variety of options, upgrades and retrofits are available to configure the product to customer applications such as; automotive battery management systems (BMS) for electric (EV) and hybrid electric vehicles (HEV) and precision power regulators.

Productivity

• Up to 5,300 UPH
• Up to x8 test site parallelism
• Fast index time 0.38 s
• High temperature accuracy
• Easy package style conversion in 15 mins
• Kitable system for QFP, BGA, PGA, QFN and other packages

Thermal Control System

T-Core

T-Core™ thermal system provides industry-leading Active Thermal Control (ATC) up to 800 W power dissipation. T-Core dynamically compensates device overheating, minimizing yield loss.

Capabilities

• Computing & Network 
• Industry-leading T-Core Active Thermal Control (ATC) for up to 800 W power dissipation
• Full data correlation to multi-site ATC test handlers
• Scalable architecture to support multiple sites with 3 RTD sensors per site
• Supports tri-temp testing with single insertion
• Intuitive, configurable software user interface

Gravity

Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing

Cohu is the market leader in gravity test handler. With ~6,000 gravity systems installed base.

Rasco SO1000

Tube to Tube Gravity Handler

Gravity handler with the largest installed base, mature design and high reliability provides excellent cost of test.

Key Features

High Productivity

Up to 14,000 UPH.

Package Sizes

Wide applicable device range MSOP 118 mil to SO 430 mil. QFN 3 mm to 12 mm.

Temperature

Full tri‐temp range ‐60°C to +175°C, with temperature accuracy +/- 2°C.

Tube Input and Output

With quick adjustment and four manual outputs.

Fast Conversion

Fast and easy kit conversion.

MEMS Test

Multiple MEMS Stimuli available.

High Parallel Test

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test

MCT FH-1200

High-Throughput Film Frame Test Handler

FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).

Key Features

• Wafer Ring Support
• High Productivity
• Optional Reject Mark Laser
• End-of-Line Processing
• Versatility
• Ultra-Small QFN Testing

Turret Test and Scan

Turret platforms for semiconductor test, inspection and packaging

Ismeca NY20

Highest Throughput for Fragile Devices

The NY20 is a 20-position turret platform for semiconductor test, inspection and packaging, and provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.

The NY20 also integrates with Cohu’s latest advanced inspection technologies such as 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with a high-resolution camera.

Featuring Cohu’s DI-Core Data Intelligence System providing real-time equipment monitoring and data analytics for Industry 4.0/Factory Automation.

• Up to 50,000 UPH. Robustness with MTBA >120 min.
• Wide applicable device ranges; QFN, DFN 0.3 x 0.6 mm to 12 x 12 mm. SOT, SC, SOD 1.0 x 0.6 mm to 6 x 6 mm. SO, TSSOP, TO, D2PAK, LED.
• Fast Conversion time 20 to 60 minutes.
• Tube Output. Tape and Reel Output.
• Autonomous operation and stability.
• Advanced Vision with Infrared Technology